Micromanipulator and Probes for Electron Microscopes

Give your microscope a hand - add new capabilities and functionality to your instrument.

The Kleindiek Nanotechnik micromanipulators and probes are versatile and easy-to-use instruments that transform your electron microscope from an observational instrument into a hands-on tool. These systems are complete solutions for applications such as manipulation of nano-objects and electrical characterization of nano-structures by probing.

Through the compact design, multiple manipulators can be integrated in a system without interfering with the standard microscope system and are insensitive to vibrations.

Also available from Kleindiek Nanotechnik are SEM and FIB substages which enhance the accuracy and functionality of standard SEM/FIB sample stages.  Applications include lithography, cell counting, and failure analysis where ultra- precise sample positioning is required.

Various other plug-in modules have been developed for specific applications such micro-injection of gasses and liquids, 4 point probing, force measurement, nano-indentation, and tensile measurement of samples in electron microscopes and FIBs.

Oxford Instruments America has signed an agreement for sales and service of Kleindiek’s unique products for applications in Electron Microscopy and Focused Ion Beam technology in the United States and Canada. 

For more information in North America contact

Oxford Instruments America NanoAnalysis
300 Baker Avenue
Concord, MA 01742 USA
 +1 978 369 9933
 +1 978 369 8287
 info@ma.oxinst.com
 www.oxford-instruments.com

For the rest of the world

Kleindiek Nanotechnik GmbH
Aspenhaustrasse 25
Reutlingen 72770
Germany
Office: +49 7121 345 395-0
Fax: +49 7121 345 395-55
Email: info@nanotechnik.com
Web: www.nanotechnik.com/