Advances in Atomic Level Technology

Atomic Level Microscopes

ALIS Corporation's revolutionary Atomic Level Ion Source

Using a beam of helium ions as the imaging particles, higher resolution and greater detailed images can be generated because ions can be focused into a smaller probe size and have less sample interaction than electron beam instruments. For more information.

Secondary Ion Mass Spectrometry

SIMS for Membranes

Using a combination of SIMS and AFM, researchers are closer to the goal of describing the complexity of membrane organization
with high spatial resolution and a high degree of chemical information. Research Highlights, Nature Methods, vol 3. No.12 p. 962-963.

Atomic Force Microscopy

The World’s Smallest Fountain Pen?

New microscope tips use capillary action to print patterns tens of nanometers across. From NSF

Single-molecule recognition imaging microscopy

Describes a technique in an AFM that allows recognition of a specific type of molecule in a complex sample (chromatin) while simultaneously yielding high-resolution topographic images. C. Stroh et al., PNAS, 2004, vol. 101, no. 34