Omniprobe Consumables and Accessories 

Ted Pella, Inc, Redding, CA, announces that they have been appointed distributors for the Omniprobe FIB lift-out consumables and accessories. 

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Silicon Dioxide Support Films 

Ted Pella, Inc, introduces the next generation of Silicon Dioxide Support Films for analytical electron microscopy. 

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New SEM Specimen mounts and holders introduced 

Ted Pella, Inc has introduced a large number of new SEM specimen mounts and holders developed in cooperation with SEM users. 

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Micro and Nano Manipulation Accessories for Oxford Instruments 

Oxford Instruments NanoAnalysis America annouces an agreement with Kleindiek Nanotechnik to become the North Americans sales and service representative for Kleindiek micro- and nano-manipulation systems for electron microscopy and focused ion beam (FIB) applications. 

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Remote Monitoring Control a Key Feature of ETS-Lindgren’s 

ETS-Lindgren announced the launch of proprietary remote monitoring control technology with its Magnetic Active Compensation System (MACS) for Electron Microscopy (EM) Applications. 

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Tescan SEM with Cryo Preparation 

TESCAN, s.r.o. is proud to announce that the first Turbo Pumped Cryo Preparation System PP2000T by Quorum Technologies Ltd. has been installed on Tescan VEGA LMU SEM. 

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