Bruker AXS to Aqui e S.I.S. Surface Imaging Systems GmbH 

Bruker AXS has announced and agreement to acquire atomic force microscopy (AFM) company S.I.S. Surface Imaging Systems GmbH 

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ORION™ Helium Ion Microscope 

Carl Zeiss SMT officially launches the revolutionary new microscopy technology that pushes physical limits for ultra-high resolution surface and material contrast imaging at unrivalled depth-of-focus. 

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Pacific Nanotechnology introduces Nano-DST 

Pacific Pacific Nanotechnology introduces Nano-DST advanced platform for AFM research applications for use with the most challenging AFM imaging applications. following requests from the research community, PNI announce the first SPM platform to have dual scanning technology. 

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Agilent Technologies’ New High-Performance Beamsplitters 

Agilent Technologies Inc. (NYSE: A) announced a new family of high-performance thin-film beamsplitters designed to provide precision beam control. 

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NANOSENSORS™ Silicon Magnetic Force Microscopy Probe Series 

NANOSENSORS™ has launched a new series of silicon probes for Magnetic Force Microscopy (MFM) today. 

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Heated Tip-AFM imaging Capability 

Anasys Instruments has introduced a new imaging capability. Using the ability to control the heat at the end of the tip, users of the NanoTA accessory may now image surfaces to study the change in topography as the surface undergoes physical change. 

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