EDS microanalysis makes it possible to determine the element composition and concentration of a sample with a Scanning Electron (SEM) or Transmission Electron Microscope (TEM). Bruker AXS Microanalysis provides an EDS system, that surpasses all expectations. QUANTAX delivers fast reliable results across a broad range of applications using real time spectrometry, high speed element mapping or Position Tagged Spectrometry (PTS) for all kinds of samples ranging from ceramic materials, powders and metals to coatings. Its integrated liquid nitrogen free XFlash Silicon Drift Detectors (SDD) are vibration and maintenance free, while delivering unbeatable energy resolution at high count rates.
