Nikon and JEOL Join Forces to Introduce NeoScope Benchtop SEM 

Two of the world’s leading imaging equipment suppliers - Nikon Instruments and JEOL - have joined forces to bring a new benchtop SEM to the market. The two companies will jointly introduce the NeoScope at Pittcon 2008, March 3-6, in New Orleans, Louisiana. 

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Intellection launches QEMSCAN® R-series 

Intellection is taking sophisticated automated mineral analysis out into the field, with the launch of its new compact QEMSCAN® R-series. 

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FEI Introduces Titan Krios(TM) TEM for Structural Biology 

Revolutionary cryo transmission electron microscope (TEM) provides fast, fully-automated three-dimensional data about biological molecules and macromolecular complexes. 

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New "CarryScope" Mobile Scanning Electron Microscope 

The JEOL CarryScope delivers several high resolution performance imaging and analytical capabilities in a new mobile package. 

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MultiBeam SEM/FIB for Simultaneous Micro Milling and High Resolution SEM Imaging 

A versatile all-in-one system that combines Focused Ion Beam micro milling with high resolution imaging. 

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New Monochromated ZEISS LIBRA® Transmission Electron Microscope 

Innovative monochromator module for unrivalled spectroscopic imaging is now available for the ZEISS LIBRA® 200 TEM series. 

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