SWIFTTM and DuoScanTM - New Fast Scanning Raman Technology 

HORIBA Jobin Yvon have introduced two new fast Raman scanning technologies. SWIFT and DuoScan now make incredibly fast Raman imaging a reality. 

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JEOL DART mass spectrometer ion source awarded second patent 

JEOL USA Inc.announced that the DART™ (Direct Analysis in Real Time) technology for open-air mass spectrometry has been awarded U.S. Patent that covers the method of ionization of the DART process. 

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New FluoroMax®-4 Bench-top Spectrofluorometer 

HORIBA Jobin Yvon is proud to announce the new FluoroMax®-4 as the replacement to the legendary FluoroMax®-3. 

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Broadband UV-Visible-NIR Microscope 

Craic Technologies introduces the UVM-1™, a UV microscope with a spectral range that covers the ultraviolet, visible and NIR regions. 

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New research-grade FT-IR microscope 

Thermo Electron Corporation introduces the new Nicolet™ Continuµm XL, a research-grade FT-IR microscope that provides high performance infrared sampling, excellent visible-light microscopy and exceptional FT-IR imaging. 

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Sub Micron Analysis - Raman/AFM 

Horiba Jobin Yvon the world leaders in Raman spectroscopy has announced the launch of its new series of LabRAM Raman microscopes compatible with AFM coupling and integration. 

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