MADISON, Wis. (March 8, 2004) – Thermo Electron Corporation introduces the new Nicolet™ Continuµm XL, a research-grade FT-IR microscope that provides high performance infrared sampling, excellent visible-light microscopy and exceptional FT-IR imaging on booth #1475 at PITTCON, Chicago, March 8 – 11.

The innovative design of the Nicolet™ Continuµm XL adds imaging capability to the renowned Nicolet™ Continuµm IR microscope, which incorporates advanced microscopy features including simultaneous view and collect, dual remote sample masking, Reflachromat compensating objectives and visible contrast and illumination techniques.

The Nicolet™ Continuµm XL features an exclusive optical design that enables users to perform single-point collection and imaging on the same system without compromising the performance of either mode of operation. In single-point mode, dual remote sample masking provides optimum spatial resolution, enabling pure spectra to be obtained from the smallest of samples. In imaging mode, high fidelity optics allow rapid collection of sharp images.

The Nicolet™ Continuµm XL is supported by new versions of OMNIC™ and Atlµs software, which provide excellent visualization and image processing capabilities. Users are able to link spectra, video images and chemical images into a single organized window. The software supports the collection of single points, line and area maps when using a single element detector and images when using an array.