Bruker AXS Microanalysis is proud to announce the Xflash® 5000 series of liquid-nitrogen free Xflash® silicon drift detectors for use with the QUANTAX microanalysis systems. These new detectors boast improved energy resolutions down to 123 eV at Mn-Ka and 100,000 cps input count rate. All detectors are equipped with an optimized electron trap, which supports interference-free elemental analysis even at very low excitation energies. The Xflash® 5000 family consist of three members:

The Xflash® Detector 5010 is a 10 mm² that that provides superior light element performance. With its 123 eV at Mn K it displays an energy resolution of 46 eV at C Ka and 54 eV at F Ka. This allows for a peak resolution in the energy range below 1 keV that is previously unheard of for an energy-dispersive detector. QUANTAX’ worldwide most comprehensive atomic database that also contains N-lines ensures correct identification of elements measured in that range.

Second member of the family is the Xflash® Detector 5030. It contains a 30 mm² SDD chip in a detector finger that is no wider than that of the Xflash® 5010. The detector can therefore be used at very short detector to sample distances, providing optimized solid angle for applications with low X-ray quantum yield. This detector is the instrument of choice for use with cold field emission SEMs and TEMs.

Bruker’s Xflash® QUAD 5040 Detector is a four channel detector, with four 10 mm² sensors integrated on a single chip, provides four times the count rate of a single 10 mm² detector at an energy resolution of 123 eV at Mn-Ka. The QUAD is equally suitable for measurements at low and high count rates. With a maximum input count rate capability of well beyond 3,000,000 cps it is suitable for use on microprobes during normal operation. It expands the area of application for these instruments to simultaneous multi-element analysis, fast mapping and spectral imaging at low to medium magnifications and analyses of rough samples and particles.