SEMTech Solutions, an established provider of reconditioned Scanning Electron Microscopes (SEMs), has recently hired Dr. Ernest T. Dobi to manage its new Field Emission (FE) SEM services laboratory.

The laboratory is equipped with two FE-SEMs. The first FE-SEM will be primarily used for its analytical capabilities that include an Energy Dispersive Spectrometer and a Back Scattered Electron detector, as well as providing Secondary Electron Imaging. The second FE-SEM, a 3-D metrology system from Elionix in Japan, can measure surface height roughness profiles ranging from 1 nm to several hundred microns. The Elionix system is targeted at metallurgical companies where an AFM has trouble measuring large surface roughness height deviations or wide lateral measurement fields.

"The benefits of our SEM services laboratory will be to provide companies with a cost effective solution," states Gerry O’Loughlin, SEMTech Solutions president. "By being able to tap into Dr. Dobi’s vast knowledge and experience, customers will be getting additional outside consultation in terms of best SEM practices."

SEMTech Solutions’ existing refurbished SEM customer base ranges from start-ups to Fortune 100 companies. The applications of these companies vary widely from materials analysis to semiconductors to life sciences.

Companies that are interested in SEM services should contact Dr. Dobi directly at edobi@semtechsolutions.com, or by phone at (978) 663-9822 x232.