Two new revolutionary detector technologies from Oxford Instruments offer the right tool for every application. INCA PentaFET-x3 and INCA x-act are integrated with the market leading INCA Energy platform and provide unrivalled performance, productivity and convenience, whatever the analytical requirement.
INCA PentaFET-x3 is a powerful new Si(Li) detector, which has a 30mm 2 detecting crystal, with the same resolution as a traditional 10mm 2 . Using INCA PentaFET-x3 you can achieve increased time to result or better quality results in the same analysis time, with no compromise in resolution or analytical performance.
INCA x-act is the worlds first Analytical Drift Detector. It combines the speed of silicon drift detector technology, with the precision and accuracy of an external FET and Oxford Instruments digital pulse processing. In applications where high-count rates can be generated, the performance of INCA x-act offers accurate EDS analysis in seconds.
'These developments in detector technology will revolutionise microananlysis' said Simon Burgess, Marketing Manager at Oxford Instruments NanoAnalysis. 'There are real benefits in using an INCA PentaFET-x3 detector for all applications, and in addition, this detector generates new opportunities for accurately analysing nanostructures in the SEM . For analysing larger structures, and where high beam currents are achievable INCA x-act has the potential to reduce data collection times significantly.'
About Oxford Instruments NanoAnalysis
With over 30 years of innovation, Oxford Instruments NanoAnalysis is the world's leading supplier of analysis systems that provide detailed structural and chemical information at the nanoscale. The ability to characterise and measure at the nanoscale is fundamental from research through to commercialisation
The company's world leading X-ray analysis and electron diffraction systems provide the critical chemical and structural information at the required scales of 1 to 100 nm, extending the capabilities of Transmission (TEM) and Scanning ( SEM ) Electron Microscopes. As well as meeting the current demand for materials characterisation, OINA is leading the development of existing and new techniques for improved spatial resolution to meet the emerging analytical challenges within nanotechnology.
Oxford Instruments has guided the development of EDS analysis with over 30 years of hardware innovation and a rich history of technological achievement. OINA provides World class manufacturing, sales and distribution combined with global support and service.