IXRF Systems provides new EDS systems and detectors for scanning and transmission electron microscopes, EDS system upgrades with digital imaging and light element window detectors, and combined EDS/XRF using the new fX-SEM™ Tube as the source of the x-ray photons and a high- quality EDS detector to produce accurate quantitative analysis even for trace elements in a scanning electron microscope. Expect more from your Microanalysis Company.
