FEI's new Titan G2 80-200 with ChemiSTEM technology enables atomic spectroscopy of more elements at higher resolution.
A new 200kV Transmission Electron Microscope from JEOL delivers high throughput nano-analysis for process and quality control of mass produced semiconductor and materials samples.
JEOL has developed a new generation of Energy Dispersive Spectrometer (EDS) for ultrafast, ultrasensitive collection of X-rays through analysis with its Scanning Transmission Electron Microscopes (S/TEM).
LIBRA series Transmission Electron Microscopes (TEM) now offer the ZEMAS Framework Technology which integrates inno- vative data acquisition, viewing and analysis capabilities into the LIBRA series TEMs.
More than only cross-correlation to align a raw tilt-series without fiducials, 3D reconstruction with iterative algorithms (SART, SIRT, OS-SART) using multi-GPUs, intuitive 3D/2D visualisation: DigiECT positions itself as a revolutionary alternative compared to
existing commercial and free software.
Fast, easy-to-use S/TEM dramatically increases productivity in semiconductor manufacturing and materials science applications.
A quantum leap in low-dose, high-contrast biological imaging the FEI Falcon Direct Electron Detector allows life scientists to see biologically-significant detail that could not be seen before