Microscopy Web Resources and News

Electron Microscope Sample Preparation News


2011

INGRAIN, Digital Rock Physics Lab Orders Further AURIGA CrossBeam®

Intensified cooperation in the nanoscale analysis of shale and tight gas sand rock samples.

True Surface Microscopy wins prestigious 2011 R&D100 Award

WITec’s True Surface Microscopy has been selected as a winner of the prestigious 2011 R&D 100 Award. It honors the WITec innovation as one of the 100 most technologically significant developments of the year.

Vion PFIB System for Advanced IC Packaging

FEI released the Vion™ plasma focused ion beam (PFIB) system that removes material more than 20 times faster than existing FIB technologies.

TESCAN introduces the first Plasma FIB-FESEM Workstation

Tescan has introduced the FERA3 XMH – a high resolution Schottky Field Emission scanning electron microscope with a fully integrated Plasma source focused ion beam. The system has been developed in co-operation with the French company Orsay Physics.

2010

Ilion+™: Planar Surface Preparation for SEM Cross Section Viewing

Ilion+™ is a significant advancment in the preparation of large planar cross sections for microscopic imaging and microanalysis.

EMS Series of Rotary Pumped Modular Coating Systems

Electron Microscopy Sciences is pleased to offer the EMS 150R, a compact rotary-pumped coating system. The EMS 150R boasts high quality performance and flexibility and is ideally suited for SEM and other coating applications.

Electron Microscopy Sciences Offers Graphene Support Films

Electron Microscopy Sciences has announced the addition of graphene transmission electron microscope support films to its product line. The new graphene support film provides an invisible, crystalline background that enables the unrivaled TEM characterization of organic and inorganic nanomaterials.

2009

Electron Microscopy Sciences Offers New High Precision Tissue Slicers

Electron Microscopy Sciences has added the EMS7000smz and EMS5000mz high precision vibrating microtomes to their products line for microscopy and histology.

Ted Pella, Inc offers Substratek™ metallic TEM substrates

New Substratek™ a set of innovative, electron transparent, metallic TEM substrates that allow for subsequent TEM examination without the need for time consuming and expensive specimen preparation.

2008

LYNX II Automated Tissue Processor for Histology and Microscopy

EMS is proud to announce the most unique state-of-the-art tissue processor which not only is compatible with all plastic resins but paraffin waxes as well.

A Complete line of Mountants replacing the original BioMeda™ Line

Electron Microscopy Sciences now offers a line of mountants to replace products from BioMeda™.

New LYRA FEG for FIB-SEM

Tescan introduces new models from the LYRA FIB-SEM series. The new LYRA FEG is based on a Schottky field emission SEM for brilliant high resolution imaging