Low Temperature Scanning Electron Microscope image
facinating site on the scanning electron microscopy of foods and food born bacteria. Images and articles from several microscopist are included.
The site includes the recommended guidelines for the forensic examination of gunshot residues by scanning electron microscopy energy dispersive analsysis, a gallery of scanning electron microscope images and the results of contamination studies,
Charles Oatley stands with Manfred von Ardenne as one of the two great pioneers of scanning electron microscopy. Oatley's pioneering work led directly to the launch of the world's first series production instrument - the Stereoscan - in 1965.
The Microscopy Listserver/Mailreflector System is a telecommunication (Email) based discussion forum giving members of the scientific community a centralized Internet address to which questions/comments/answers in the various fields of Microscopy or Microanalysis can be rapidly distributed to a list of (subscribed) individuals by electronic mail.
Dennis, well known for his scanning electron microscope images, also has an Image Library that includes stunning polarized light microscope images of drugs, vitamins, hormones, amino acids, proteins, and other crystalline specimens.
Stunning scanning electron microscope images taken by France Bourély. France is a scientist, an artist, and explorer. Her images capture both the beauty of the wonderment of the microscopic world
Images submitted to FEI's users image contest.
Images from scanning electron microscopes, transmission electron microscope images, DualBeam instruments, and focussed ion beam. The site includes images taken by users of FEI instruments and by FEI. the images are organized by instrument and by area of interest.
An overview that includes electron microscope techniques, specimen preparation, cryo, Single Particle Reconstruction
A detailed interactive animation that illustrate the basics of imaging in the Scanning Electron Microscope (SEM).
Includes technical introduction to scanning and transmission electron microscopy with emphasise on FESEM and image gallery.
Learn about the basics and capabilities of electron microscopy.
The goal of this site is to explain the basics of most electron microscopy methods without giving too much of the complex theory and mathematics behind it. Thus, reading these pages can in no way substitute the study of textbooks.
Scanning Electron Microscopy course notes covers the basics of electron beam formation and sample interactions.
The Virtual Microscope, which is available for free download supports functionality from electron, light, and scanning probe microscopes, datasets for these instruments, training materials to learn more about microscopy, and other related tools.
An Ebook that includes the basic principals of operation, image display, the role of secondary and backscattered electron detectors, and the vacuum system. Further explanation of the SEM includes edge effect, the influence of accelerating voltage, the illumination effect of secondary and backscatter electron detectors, techniques for improving image resolution, benefits of different types of electron guns, elemental analysis, and sample preparation.
A compilation of frequently asked questions received by the JEOL staff during demonstrations and training. Such as: how to mount powder samples, selecting the accelerating voltage, stereoscopic observation techniques, and more.
A section on focussed ion beam instruments is included in the FEI booklet "An Introduction to Electron Microscopy". The booklet is an excellent overview of of electron microscopy and nanotechnology for students and teachers. It is available as a pdf for download.
More Helpful Sites
NIST researchers have developed a modified form of scanning electron microscopy that can reveal the magnetic characteristics of such a surface without disturbing the magnetization.
Dr. Danilatos has been pioneering the developement of the ESEM since 1978. This is his description of Environmental Scanning Electron Microscopy and list of publications.