TESCAN, a leading world manufacturer of charge particle technology, has named Jeff Streger their Vice President of Sales and Marketing, North America.
Carl Zeiss announces that it has signed an exclusive, world-wide agreement with Fugro Robertson to develop and distribute RoqSCAN™
Integrated sample holder and software interface enables researchers to locate areas studied by light microscopy in a scanning electron microscope making correlation between light and electron microscopy easy.
The LYRA GM FIB-SEM workstation from TESCAN delivers state of the art integration of a best-in-class Focused Ion Beam column and Field Emission Scanning Electron Microscope, while integrating an unprecedented range of nano-structuring, imaging, and nano-analytical tools.
Carl Zeiss today announced that the Indianapolis Museum of Art is using a Carl Zeiss 'Shuttle & Find' Correlative Microscopy package in the museum's new state-of-the-art conservation science laboratory funded by Lilly Endowment Inc.
The JEOL InTouchScope™ SEM, a touchscreen-controlled analytical, portable low vacuum Scanning Electron Microscope, has been recognized by the editors of R&D Magazine as one of the 100 most technologically significant products introduced into the marketplace over the past year.
The SU9000, a new type of Field Emission Scanning Electron Microscope (FE-SEM) capable of ultra-high resolution imaging, is equipped with a electron source that enables ultra-high resolution observations, while minimizing sample damage caused by electron beams during observations.
Hitachi High-Technologies Corporation (TOKYO:8036) today announced the development of the Tabletop Microscope TM3000.
XEI Scientific, Inc. announced that they have retained new executive level advisors to direct worldwide sales and marketing.
Automated mineralogy technology suite now provides improved measurement and image analysis capabilities for mining, oil and gas and geoscience applications
FEI has launched a website for natural resources as part of an increased focus on the mining and oil & gas industries. The website will serve as a technical and educational resource.
Agilent Technologies FE-SEM is a compact system that offers researchers a field emission scanning electron microscope for low-voltage, high-performance imaging in their own laboratory.
TESCAN, a.s. is pleased to announce the acquisition of TESCAN USA Inc
Third generation of TESCAN microscopes cumulates nearly 20 years of experience from research, development and manufacturing of scanning electron microscopes, supplementary accessories for SEMs and other special products.
The first of its kind, the Magellan SEM from FEI enables life science researchers and cell biologists to actually view the entire organization of a cell in its natural, fully-hydrated state. The Magellan's workflow solution, which includes cryogenic sample preparation and handling, is a repeatable, optimized process to provide the highest quality imaging and analysis results.
Tescan recently introduced the Vega EasyProbe with integrated One - Touch EDX microanalysis.
JEOL introduces the JEM-ARM200F atomic resolution analytical Scanning/Transmission Electron Microscope.
Novelx mySEM® miniaturizes and drives the cost out of field emission scanning electron microscopes to distribute nanoscale imaging capabilities more broadly.
JEOL introduced ClairScopetm, a first-of-its kind correlative microscopy tool that combines a high-end Light Microscope (LM) with a high-resolution Atmospheric Scanning Electron Microscope (ASEM)