Published articles on using EDS microanalysis for characterization of contaminents and particles. Microscopy Today article titled Applications for Automated Particle Analysis is avaialble in pdf format.
The site includes tutorials on Energy dispersive spectrometry hardware, Wavelength dispersive X-ray microanalysis and Energy dispersive X-ray microanalysis for the TEM and the on-line microanalysis encyclopaedia.
Written by Oxford Instruments' team of detector experts, this 28 page booklet covers the principles of SDD in detail. Information is presented is an easy to understand format with drawings and graphs that will benefit students as well as experts. Topics include electron beam and specimen interactions, generation of X-rays from the sample, detextion of x-rays by the SDD, processing of the raw data, and how artefacts such as ballistic deficit and pulse pile are managed.
Desktop Spectrum Analyzer is an X-ray data analysis program for the Macintosh platform. The NIST/NIH Desktop Spectrum Analyzer generates, interprets and analyzes x-ray spectra from specimens under electron bombardment.
Struder L, Meidinger N, Stotter D, Kemmer J, Lechner P, Leutenegger P, Soltau H, Eggert F, Rohde M, Schulein T., MPI fur Extraterrestrische Physik, Halbleiterlabor, Paul-Gerhardt-Allee 42, D-81245 Munich, Germany