EDAX has release of the Apollo Silicon Drift Detector (SDD) Series for the transmission electron microscope (TEM). The new series includes the Apollo XLT with a Super Ultra Thin Window (SUTW) and the Apollo XLTW, a windowless version.
The e Flash HR, a high resolution, high sensitivity detector for electron backscatter diffraction analysis (EBSD) on third party electron microscopes.
AZtec, from Oxford Instruments NanoAnalysis, is designed to integrate all microanalysis techniques and unleash the potential of the latest detectors. The first release offers EDS and EBSD: users can collect chemical and structural information simultaneously without compromising speed or functionality.
The highly successful X-Max 80 detector is now available for use on Transmission Electron Microscopes. This detector has solid angles significantly greater than any commercially available SDD for TEM.
Bruker introduced the XFlash® 5060 T, the latest addition to the XFlash® family of detectors for X-ray micro- and nanoanalysis (EDS) in electron microscopy. The XFlash® 5060 T is one of two detectors available for use on (scanning) transmission electron microscopes.
The new NordlysNano electron Back Scatter Detector from Oxford Instruments is 60% more sensitive than the previous generation of EBSD detector, the NordlysS.
EBSD.com covers the underlying physics and the various applications of the technology in great detail.
State-of-the Art System Incorporates Smart Features For Better Quality and More Reliable Results
To better align ourselves with our market and reflect our expanding product portfolio, Bruker AXS Microanalysis has changed its name to Bruker Nano.
EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has introduced the next series of Apollo SDD detectros for X-ray microanalysis.
EDAX Inc has introduced OIM™ 6.0-the first microanalysis package to be written for 64 bit processor and Microsoft® Windows 7 compatibility with datasets reaching >40 million data points.
EDAX offers a range of tools and technologies used in chemical characterization of photovoltaic materials. Measuring the composition of elements helps determine device performance. In addition, the distribution of specific elements can provide valuable information into grain boundary performance and localized electrical fields.
EDAX Inc. has launched EXpert ID, which provides a significant increase in peak identification accuracy based on an advanced physics and rules-based algorithm.
EDAX Inc. launches DigiView IV bringing all of the advanced features of orientation mapping and calculations to the materials calculation scientist.
EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has launched the Genesis Apex X-ray microanalysis system
MonoCL4 is the next generation in the world-leading family of cathodoluminescence (CL) systems.
Bruker AXS Microanalysis presents the e-Flash, a new high performance detector for electron backscatter diffraction (EBSD) analysis on scanning electron microscopes (SEM).
Bruker AXS Microanalysis presents Xflash® 5030 T, the first silicon drift detector (SDD) specifically designed for energy dispersive X-ray spectroscopy (EDS) on transmission electron microscopes (TEM/STEM).