LYRA GM FIB-SEM workstation, a New Multifunctional Tool for Nanotechnology
LYRA GM FIB-SEM workstation, a New Multifunctional Tool for Nanotechnology
BRNO, Czech Republic — (BUSINESS WIRE) — July 25, 2011 — TESCAN, a world leading manufacturer of scanning electron microscopes and focused ion beam workstations has introduced the LYRA GM FIB-SEM workstation “A New Multifunctional Tool for Nanotechnology”
Expanding on the success of the European FIBLYS project ( http://www.fiblys.eu), this newest generation FIB-SEM workstation from TESCAN delivers state of the art integration of a best-in-class Focused Ion Beam column and Field Emission Scanning Electron Microscope, while integrating an unprecedented range of nano-structuring, imaging, and nano-analytical tools. The integration of so many complementary analytical tools will allow researchers to characterize complex samples and solve analytical problems rapidly.
The LYRA GM can be configured with a variety of Focused Ion Beam sources and is the first in its class to integrate a Time of Flight secondary ion mass spectrometer (TOF-SIMS) and in-situ Atomic Force Microscope (AFM).
“Advancements in nanotechnology have lead to a growing need for a multi-functional instrument,” said Martin Zadrazil, Managing Director of TESCAN. “In most lab environments multiple instruments are required to provide complementary analytical information. The LYRA GM will allow researchers to have access to multiple techniques on one single platform.”
Access to these techniques in one single instrument can provide a user with several benefits.
- Multiple analytical techniques can be performed simultaneously from the same point of interest while milling through a sample with the Focused Ion Beam.
- Complementary information from several techniques will enable researchers to analyze nano-structures just after preparation or even during production.
- Critical in-situ measurements, in the same workstation, will benefit experiments for samples that cannot be exposed to contamination or oxidation.
The ability to perform in-situ TOF-SIMS and SPM/AFM will provide unprecedented analytical capabilities. TOF-SIMS provides better limits of detection, better spatial resolution, depth profiling and the ability to detect isotopic and molecular species. Chemical imaging with a resolution of about 50 nm has been demonstrated.
The integration of an in-situ AFM not only provides roughness information, but will also allow true 3-dimensional chemical images to be reconstructed from SIMS measurements.
Contact information:
| Web: | Tescan USA, Inc. |
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| Info: |
Tescan USA, Inc.
TESCAN, a.s. |