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Abberation Corrected Electron Microscopes

Electromagnetic lenses in an electron microscope are subject to chromatic, spherical and higher-order aberrations which limit the resolution to about 100 times the wavelength of the electron. By correcting for the distortions an electron microscope can acheive resolution near 0.05 microns and produce much clearer images of the inner structure of materials.

The Team Microscope, a part of DOE’s 20-year roadmap of Facilities for the Future of Science, is the first of a new generation of intermediate- voltage abberation corrected electron microscopes. Led by Lawrence Berkeley National Laboratory’s National Center for Electron Microscopy, TEAM is a collaborative project with microscopy programs at Argonne National Laboratory, Brookhaven National Laboratory, and Oak Ridge National Laboratory.  Manufacturer FEI Corp. of Hillsboro, Oregon is the major commercial partner for column integration and column construction, and electron optics manufacturer CEOS, of Heidelberg, Germany, for development and implementation of aberration correctors.

Contact information:

Info:     FEI Company