QUANTAX – Precision Tools for Nano-scale Analysis
Bruker AXS Microanalysis has more than 40 years experience in the production of energy-dispersive spectrometers and detectors for X-ray microanalysis in electron microscopes. We have also pioneered the application of liquid nitrogen free silicon drifts detectors (SDDs) for this purpose. Bruker’s XFlash® SDDs have been commercially available for more than a decade.
The fifth generation of Bruker SDDs – the current XFlash® 5000 series consists of 3 detectors:
- The XFlash® 5010 with 10mm² active area for applications that require optimum energy resolution and light element performance,
- The 30 mm² XFlash® 5030 for cold field emission SEMs, environmental SEMs or TEMs,
- The four-channel XFlash® QUAD 5040 with four 10mm² sensors integrated on a single detector chip provides excellent energy resolution also at extremely high count rates, e.g. ideal for use on microprobes.
X-ray map of a SD memory chip
The QUANTAX EDS system combines theses detectors with Bruker’s unique hybrid pulse processors and the ESPRIT software. The result is a powerful and easy-to-use spectrometer that can be adapted to any task in elemental analysis with an electron microscope.
Contact information:
| Web: | Bruker Nano GmbH |
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| Info: |
Bruker Nano GmbH
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