Carl Zeiss NTS, LLC
FIB workstations, variable and conventional scanning and transmission electron microscopes
Carl Zeiss NTS (Nano Technology Systems Division) offers a complete range of leading-edge microscopy and analysis instruments, including: FE-SEMs, multipurpose and extended pressure SEMs, energy filtering TEMs, CrossBeam® FIB/SEM workstations, and resolution record-setting Helium ion microscopes - providing solutions for the semiconductor, materials analysis and life science industries. With this broad product portfolio, Carl Zeiss NTS offers one-stop solutions for imaging — including 3D volume rendering and reconstruction — testing, characterization, manipulation, process control and failure analysis.
One Corporation Way
Peabody, MA 01960
Phone: 978 826 7909;